US EditionA Universal Deep Learning Model For Segmenting Automated Optical Inspection Images
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A Universal Deep Learning Model For Segmenting Automated Optical Inspection Images
A new technical paper titled “A Universal AI-Powered Segmentation Model for PCBA and Semiconductor” was published by researchers at Nordson Corporation. “This paper introduces a novel universal deep learning model designed to segment AOI images for both PCBA and 17 semiconductor components, offering a more robust and adaptable solution for defect detection,” states the paper. Read more here. Authors:Charlie Zhu, Stephan Pirner, Srinivas Subraman…
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